DocumentCode
3034477
Title
Soft error tolerant Infinite Impulse Response filters using reduced precision replicas
Author
Reviriego, Pedro ; Maestro, Juan A. ; López, Isabel ; De Agapito, Juan A.
Author_Institution
Univ. Antonio de Nebrija, Madrid, Spain
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
493
Lastpage
496
Abstract
Radiation induced soft errors are a major issue in modern digital circuits. Traditional mitigation techniques like Triple Modular Redundancy (TMR) incur a large area and power overhead. This has motivated the design of ad-hoc mitigation techniques for some commonly used circuits. Among those, signal processing circuits have been widely studied. One technique proposed for Finite Impulse Response (FIR) filters is the use of reduced precision replicas to detect and correct errors. This approach significantly reduces the overhead required for protection. The use of reduced precision in FIR filters is straightforward as they do not have feedback paths that can lead to numerical problems. In this paper, the use of reduced precision replicas to protect Infinite Impulse Response (IIR) filters is studied. As IIR filters have feedback paths, the use of reduced precision poses additional challenges. In this context, a solution is proposed to avoid those potential issues. The approach is evaluated through a case study which shows its effectiveness.
Keywords
FIR filters; IIR filters; radiation hardening (electronics); FIR filters; IIR filters; TMR; ad-hoc mitigation techniques; feedback paths; modern digital circuits; radiation induced soft errors; reduced precision replicas; signal processing circuits; soft error tolerant infinite impulse response filters; triple modular redundancy; Fault tolerant systems; Finite impulse response filter; IIR filters; Redundancy; Infinite Impulse Response filters; Soft Error; digital filters;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131424
Filename
6131424
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