DocumentCode :
3034651
Title :
The influence of calibration substrate boundary conditions on CPW characteristics and calibration accuracy at mm-wave frequencies
Author :
Rumiantsev, Andrej ; Doerner, Ralf ; Godshalk, Edward M.
Author_Institution :
SUSS MicroTec Test Syst. GmbH, Sacka
fYear :
2008
fDate :
9-12 Dec. 2008
Firstpage :
168
Lastpage :
173
Abstract :
This paper presents new experimental investigations of the influence of calibration substrate boundary conditions on CPW transmission line characteristics and calibration accuracy at millimeter wavelengths. A new configuration that decreases insertion loss of CPW transmission lines and improves calibration accuracy is suggested.
Keywords :
S-parameters; calibration; coplanar transmission lines; coplanar waveguides; error correction; millimetre wave devices; substrate integrated waveguides; CPW transmission line characteristics; calibration substrate boundary condition; coplanar waveguide; error correction; millimetre wave frequency; scattering parameters measurement; Boundary conditions; Calibration; Coplanar waveguides; Couplings; Frequency; Surface waves; Tellurium; Transmission line measurements; Transmission line theory; Wavelength measurement; calibration; calibration comparison; error correction; scattering parameters measurement; surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Symposium, 2008 72nd ARFTG
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-2300-2
Electronic_ISBN :
978-1-4244-2300-2
Type :
conf
DOI :
10.1109/ARFTG.2008.4804293
Filename :
4804293
Link To Document :
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