Title :
The use of high-energy ion synchrotron at the ITEP for SEE testing of modern electronic components
Author :
Zinchenko, V.F. ; Lavrentjev, K.V. ; Lipsky, A.K. ; Ulimov, V.N. ; Alexejev, N.N.
Author_Institution :
Res. Inst. of Sci. Instrum., Lytkarino, Russia
Abstract :
The possibilities of using of high-energy heavy ion synchrotron at the Institute of Theoretical and Experimental Physics, Moscow, for single event effects testing of modern electronic components are investigated. The basic problems and offered approaches to their solution are considered. The obtained experimental data are discussed.
Keywords :
integrated circuit testing; radiation effects; synchrotrons; ITEP; Institute of Theoretical and Experimental Physics; Moscow; SEE testing; electronic component testing; high-energy heavy ion synchrotron; integrated circuit testing; single event effect testing; Integrated circuits; Ion beams; Ions; Silver; Synchrotrons; Testing; Linear energy transfer; high-energy ions; integrated circuit; sensitive volume; single event effects; straggling;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131457
