• DocumentCode
    3035231
  • Title

    A synthesizable ram bist circuit for applying an O(n log2 n) test that detects scrambled static pattern-sensitive faults

  • Author

    Cockburn, Bruce F. ; Sarda, Deepak P.

  • Author_Institution
    University of Alberta
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    57
  • Lastpage
    63
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Fault detection; Fault diagnosis; Logic testing; Read-write memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
  • ISSN
    1087-4852
  • Print_ISBN
    0-8186-7466-0
  • Type

    conf

  • DOI
    10.1109/MTDT.1996.782493
  • Filename
    782493
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3035231