• DocumentCode
    3035545
  • Title

    Processing and properties of sol-gel derived lithium niobate thin-layers

  • Author

    Eichorst, D.J. ; Hagberg, D.S. ; Payne, D.A.

  • Author_Institution
    Illinois Univ., Urbana, IL, USA
  • fYear
    1990
  • fDate
    6-8 Jun 1990
  • Firstpage
    250
  • Lastpage
    253
  • Abstract
    Sol-gel processing was investigated as a method of deposition for lithium niobate thin layers on a variety of substrates, including silicon, platinum, and sapphire. The influence of solution chemistry and thermal processing conditions on microstructure developed was studied especially for the integration of LiNbO3 on Si. An ethanol-based system gave dense layers with grain sizes ranging between 0.1 and 0.2 μm. Methoxyethanol-based systems also produced dense layers, but the grain sizes were somewhat larger, approaching 0.5 μm. Electrical properties are reported for LiNbO3 on Pt. The layers had preferred orientation, with values of dielectric constant and loss tangent of 22 and 0.005, respectively, at 25°C and 1 MHz
  • Keywords
    crystal microstructure; dielectric losses; ferroelectric thin films; grain size; heat treatment; lithium compounds; permittivity; sol-gel processing; 0.1 to 0.2 micron; 0.5 micron; 1.0 MHz; 25 degC; Al2O3; LiNbO3; LiNbO3 integration; Pt; Si; deposition method; dielectric constant; electrical properties; ethanol-based system; grain sizes; loss tangent; methoxyethanol-based systems; microstructure; preferred orientation; sol-gel processing; solution chemistry; thermal processing conditions; thin layers; Amorphous materials; Crystallization; Electrodes; Ethanol; Grain size; Lithium niobate; Microstructure; Niobium; Platinum; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
  • Conference_Location
    Urbana-Champaign, IL
  • Print_ISBN
    0-7803-0190-0
  • Type

    conf

  • DOI
    10.1109/ISAF.1990.200235
  • Filename
    200235