DocumentCode
303557
Title
Integral equation for scattering by a rough surface
Author
Marx, E.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
1
fYear
1996
fDate
21-26 July 1996
Firstpage
462
Abstract
The single integral equation method for scattering by dielectrics reduces the memory requirements for an electromagnetic scattering calculation from those of other common methods to those for a perfect conductor. This is especially important for three-dimensional finite scatterers for which the number of patches covering the surface needs to be large enough to obtain accurate results. Special considerations apply to particular configurations, such as the scattering by a rough surface represented by a measured square area, which we assume is embedded in a plane interface. The exact computation described can be used to determine the validity of approximate statistical methods, which are not necessarily accurate when the wavelength of the light is comparable to the feature size or when the surface is not a perfect conductor. We consider a homogeneous dielectric that fills a half space and has a rough surface.
Keywords
dielectric properties; electromagnetic fields; electromagnetic wave scattering; integral equations; interpolation; splines (mathematics); statistical analysis; approximate statistical methods; electromagnetic scattering; exact computation; feature size; half space; homogeneous dielectric; incident fields; integral equation; light wavelength; measured square area; memory requirements; patches; perfect conductor; plane interface; reflected fields; rough surface scattering; scattered fields; spline interpolations; surface gradient; three-dimensional finite scatterers; Area measurement; Conductors; Dielectrics; Electromagnetic scattering; Integral equations; Light scattering; Particle measurements; Rough surfaces; Surface roughness; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
Conference_Location
Baltimore, MD, USA
Print_ISBN
0-7803-3216-4
Type
conf
DOI
10.1109/APS.1996.549637
Filename
549637
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