• DocumentCode
    303628
  • Title

    Analysis of electrically large 2D objects via spatial decomposition and reduced current fidelity

  • Author

    Williams, J.H. ; Martin, A.Q.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    21-26 July 1996
  • Firstpage
    942
  • Abstract
    We present an integral equation (IE) method for the analysis of electrically large objects which involves the use of the spatial decomposition technique (SDT) and a scheme which we refer to as reduced current fidelity (RCF). We apply SDT/RCF to the analysis of perfectly conducting 2D structures under TM excitation. In the SDT an electrically large structure is decomposed into a set of much smaller subobjects and IE methods are used to determine a solution for each subobject with an account made for the presence of the other subobjects. The method of moments (MoM) is applied for the numerical solution of each subobject in a sequential manner until a solution for every object created from the decomposition is obtained. For electrically large objects, RCF allows for a significant reduction in the solution time and memory in an SDT solution by exploiting the large distance between subobjects.
  • Keywords
    conductors (electric); electromagnetic induction; electromagnetic wave scattering; integral equations; method of moments; EM wave scattering; MoM; TM excitation; distance; electrically large 2D objects; induced currents; integral equation method; memory reduction; method of moments; numerical solution; perfectly conducting 2D structure; reduced current fidelity; solution time reduction; spatial decomposition; Convergence; Integral equations; Mesh generation; Moment methods; Surface treatment; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    0-7803-3216-4
  • Type

    conf

  • DOI
    10.1109/APS.1996.549751
  • Filename
    549751