Title :
Enhanced angle sensitive pixels for light field imaging
Author :
Sivaramakrishnan, Sriram ; Wang, Albert ; Gill, Patrick R. ; Molnar, Alyosha
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
Abstract :
Previously demonstrated angle sensitive pixels (ASPs) have been shown to enable integrated digital light-field imaging in CMOS, but suffer from significantly reduced pixel quantum efficiency and increased sensor size. This work demonstrates ASP devices that use phase gratings and a pair of interleaved diodes to double pixel density and improve quantum efficiency by a factor of 4.
Keywords :
CMOS image sensors; diffraction gratings; semiconductor diodes; ASP enhancement; CMOS image sensor; angle sensitive pixel enhancement; double pixel density; integrated digital light-field imaging; interleaved diode; phase grating; pixel quantum efficiency; CMOS integrated circuits; Diffraction; Diffraction gratings; Gratings; Image sensors; Metals; Photodiodes;
Conference_Titel :
Electron Devices Meeting (IEDM), 2011 IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4577-0506-9
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2011.6131516
