Title :
Platform for JFET-based sensing of RF MEMS resonators in CMOS technology
Author :
Hwang, Eugene ; Driscoll, Andrew ; Bhave, Sunil A.
Author_Institution :
OxideMEMS Lab., Cornell Univ., Ithaca, NY, USA
Abstract :
This paper presents an RF MEMS resonator with embedded junction field effect transistor (JFET) for efficient electrical detection of the high quality factor acoustic resonance. A homogenous single-crystal silicon resonator is excited in its fundamental thickness extensional resonant mode at 1.61 GHz with a quality factor of 25,900. This device can be fully integrated into a typical SOI CMOS technology with minimal modifications to the existing front-end process. Furthermore, it achieves an acoustic transconductance of 171 μS at a bias current of 143 μA, approaching a practical range for monolithic, low-power RF systems.
Keywords :
CMOS integrated circuits; Q-factor; UHF integrated circuits; acoustic resonance; junction gate field effect transistors; micromechanical resonators; sensors; silicon; silicon-on-insulator; JFET-based sensing; RF MEMS resonators; acoustic transconductance; current 143 muA; electrical detection; embedded junction field effect transistor; frequency 1.61 GHz; high quality factor acoustic resonance; homogenous single-crystal silicon resonator; low-power RF systems; typical SOI CMOS technology; Acoustics; Actuators; JFETs; Micromechanical devices; Radio frequency; Silicon; Temperature measurement;
Conference_Titel :
Electron Devices Meeting (IEDM), 2011 IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4577-0506-9
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2011.6131591