Title :
Performance limits of a closed-loop, micro-g silicon accelerometer with deposited rigid electrodes
Author :
Yazdi, Navid ; Najafi, Khalil
Author_Institution :
Center for Integrated Microsyst., Michigan Univ., Ann Arbor, MI, USA
Abstract :
Silicon micro-g accelerometers are of increasing demand for the new generation of lightweight low cost inertial measurement units (IMUs) and microgravity measurement systems. This paper presents modeling and noise analysis of a closed-loop micro-g accelerometer with deposited sense and feedback electrodes, and direct digital output. Modeling and noise analysis have been essential to identifying the performance limits in addition to design and development of the accelerometer. The paper first briefly reviews the sensor and its interface electronics, followed by the complete time domain modeling and simulation of the closed-loop electromechanical accelerometer. The simulation results show achievement of less than 10 μg direct digital output in a ±1 g range, which is equivalent to 17.6 bits dynamic range. Also, the mechanical and electrical noise analysis indicate a noise floor of 0.72 μg/√Hz without vacuum packaging
Keywords :
accelerometers; elemental semiconductors; inertial navigation; microsensors; semiconductor device models; semiconductor device noise; silicon; time-domain analysis; zero gravity experiments; Si; Si micro-g accelerometers; accelerometer development; closed-loop electromechanical accelerometer; closed-loop micro-g accelerometer; closed-loop micro-g silicon accelerometer; deposited feedback electrodes; deposited rigid electrodes; deposited sense electrodes; design; direct digital output; dynamic range; electrical noise analysis; inertial measurement units; interface electronics; mechanical noise analysis; microgravity measurement systems; modeling; noise analysis; noise floor; performance limits; simulation; time domain modeling; vacuum packaging; Accelerometers; Costs; Dynamic range; Electrodes; Electromechanical sensors; Measurement units; Mechanical sensors; Output feedback; Performance analysis; Silicon;
Conference_Titel :
Microelectronics, 2000. ICM 2000. Proceedings of the 12th International Conference on
Conference_Location :
Tehran
Print_ISBN :
964-360-057-2
DOI :
10.1109/ICM.2000.916467