Title :
Static thermal design of quasi monolithic technology (QMT) for realization of power microwave and millimeter wave circuits
Author :
Joodaki, Mojtaba ; Kompa, Günter
Author_Institution :
Kassel Univ., Germany
Abstract :
In this paper, a 2D finite element heat transfer simulation was used to optimize the quasi monolithic technology (QMT) structure and to reduce thermal resistance in power microwave and millimeter wave applications, considering limitations in the fabrication process. Effects of different factors and parameters such as epoxy thermal conductivity, distance between active device and Si substrate, front side substrate metallization and heat spreader on the back side have been described. Results show that by using a good heat spreader on the backside of the active device, total thermal resistance comparable to that in standard MMICs is possible
Keywords :
circuit optimisation; circuit simulation; cooling; finite element analysis; heat sinks; integrated circuit metallisation; integrated circuit modelling; integrated circuit packaging; microwave integrated circuits; millimetre wave integrated circuits; power integrated circuits; thermal analysis; thermal conductivity; thermal management (packaging); thermal resistance; 2D finite element heat transfer simulation; MMICs; QMT; QMT structure; Si; active device-Si substrate distance; back side heat spreader; epoxy thermal conductivity; fabrication process limitations; front side substrate metallization; heat spreader; optimization; power microwave applications; power microwave circuits; power millimeter wave applications; power millimeter wave circuits; quasi monolithic technology; static thermal design; thermal resistance; Electromagnetic heating; Fabrication; Finite element methods; Heat transfer; Microwave devices; Microwave technology; Millimeter wave technology; Thermal conductivity; Thermal factors; Thermal resistance;
Conference_Titel :
Microelectronics, 2000. ICM 2000. Proceedings of the 12th International Conference on
Conference_Location :
Tehran
Print_ISBN :
964-360-057-2
DOI :
10.1109/ICM.2000.916479