Title :
Fabrication Variations and Defect Tolerance for Nanomagnet-Based QCA
Author :
Niemier, Michael ; Crocker, Michael ; Hu, X. Sharon
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN
Abstract :
Tolerating defects and fabrication variations will be critical in any system made with devices that have nanometer feature sizes. This paper considers how fabrication variations and defects might lead to faulty behavior in Magnetic Quantum-dot Cellular Automata (MQCA) circuits and systems. Here, we leverage physical-level simulation to consider how fabrication variations might affect a circuit´s logical correctness. We then discuss how we can tolerate fabrication variations at the device, circuit, and architectural level.
Keywords :
cellular automata; logic design; nanoelectronics; quantum dots; quantum gates; architectural level; defect tolerance; fabrication variations; faulty behavior; logical correctness; magnetic quantum-dot cellular automata circuits; nanomagnet-based QCA; nanometer feature sizes; physical-level simulation; Antiferromagnetic materials; CMOS process; Circuit faults; Fabrication; Magnets; Nanoscale devices; Quantum cellular automata; Quantum dots; Stationary state; Wire; QCA; defect; fault; nanomagnets; tolerance;
Conference_Titel :
Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-0-7695-3365-0
DOI :
10.1109/DFT.2008.54
