• DocumentCode
    3039100
  • Title

    A New Technique for Jointly Optimizing Gate Sizing and Supply Voltage in Ultra-Low Energy Circuits

  • Author

    Hanson, Scott ; Sylvester, Dennis ; Blaauw, David

  • Author_Institution
    Michigan Univ., Ann Arbor, MI
  • fYear
    2006
  • fDate
    4-6 Oct. 2006
  • Firstpage
    338
  • Lastpage
    341
  • Abstract
    Mobile applications with battery lifetimes on the order of thousands of days have placed stringent energy requirements on circuits. In this paper, we propose a new energy optimization technique for ultra-low energy circuits operating in the sub threshold regime. Our technique uses simultaneous gate sizing and supply voltage scaling to reduce energy. We demonstrate the effectiveness of our technique on benchmark circuits and offer insight on the roles of the timing distribution and wire capacitance in determining the achievable energy reductions
  • Keywords
    capacitance; circuit optimisation; integrated circuit design; low-power electronics; mobile computing; scaling circuits; battery lifetimes; benchmark circuits; energy optimization technique; gate sizing; mobile applications; sub threshold circuits; supply voltage; timing distribution; ultra low energy circuits; voltage scaling; wire capacitance; Batteries; Circuits; Delay; Design optimization; Dynamic voltage scaling; Energy efficiency; Inverters; Low voltage; Minimization; Timing; Algorithms; Design; Performance; Subthreshold circuits; gate sizing; voltage scaling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design, 2006. ISLPED'06. Proceedings of the 2006 International Symposium on
  • Conference_Location
    Tegernsee
  • Print_ISBN
    1-59593-462-6
  • Type

    conf

  • DOI
    10.1109/LPE.2006.4271861
  • Filename
    4271861