• DocumentCode
    3039191
  • Title

    Faulty Failure Analyses

  • Author

    Mura, Gianluca ; Vanzi, M.

  • Author_Institution
    DIEE, Univ. of Cagliari, Cagliari, Italy
  • fYear
    2013
  • fDate
    15-19 July 2013
  • Firstpage
    599
  • Lastpage
    602
  • Abstract
    A case history of a troubled Failure Analysis (F.A.) is reported as a test for reliability of the F.A. procedure itself.
  • Keywords
    failure analysis; reliability; faulty failure analyses; test for reliability; troubled failure analysis; Assembly; Electrostatic discharges; Failure analysis; Image reconstruction; Integrated circuits; Light emitting diodes; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
  • Conference_Location
    Suzhou
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4799-1241-4
  • Type

    conf

  • DOI
    10.1109/IPFA.2013.6599232
  • Filename
    6599232
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3039191