DocumentCode :
3040133
Title :
Large-signal mm-wave InAlN/GaN HEMT power amplifier characterization through self-consistent Harmonic Balance / Cellular Monte Carlo device simulation
Author :
Guerra, D. ; Marino, F.A. ; Ferry, D.K. ; Goodnick, S.M. ; Saraniti, M. ; Soligo, R.
Author_Institution :
Center for Comput. Nanosci., Arizona State Univ., Tempe, AZ, USA
fYear :
2011
fDate :
5-7 Dec. 2011
Abstract :
We report the simulation of the large-signal performance of mm-wave FET power amplifiers obtained for the first time through Full Band Monte Carlo particle-based device simulation self-consistently coupled with a Harmonic Balance (HB) frequency domain circuit solver. Due to the iterative nature of the HB algorithm, this FET simulation approach is possible only due to the computational efficiency of our Cellular Monte Carlo (CMC), which uses pre-computed scattering tables. On the other hand, a frequency domain circuit solver such as HB allows the simulation of the steady-state behavior of an external passive reactive network without the need for simulating long transient time (i.e. RC, L/C time constants) typical of time domain solutions. By exploiting this newly developed self-consistent CMC/HB code, we were able to time-efficiently characterize the mm-wave power performance of a state-of-the-art 30-nm gate-length InAlN/GaN HEMT.
Keywords :
III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium compounds; high electron mobility transistors; indium compounds; millimetre wave amplifiers; power amplifiers; wide band gap semiconductors; InAlN-GaN; cellular Monte Carlo device simulation; frequency domain circuit solver; large-signal mm-wave HEMT power amplifier; self-consistent harmonic balance; Harmonic analysis; Integrated circuit modeling; Logic gates; Monte Carlo methods; Performance evaluation; Power amplifiers; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2011 IEEE International
Conference_Location :
Washington, DC
ISSN :
0163-1918
Print_ISBN :
978-1-4577-0506-9
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2011.6131668
Filename :
6131668
Link To Document :
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