Title :
Highly testable and compact single output comparator
Author :
Metra, Cecilia ; Favalli, Michele ; Riccò, Bruno
Author_Institution :
Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fDate :
27 Apr-1 May 1997
Abstract :
In this paper a single output self-checking n-input comparator is presented. The proposed circuit, which can be used as n-variable two-rail checker or as equality checker features a compact structure, is Totally-Self-Checking or Strongly Code-Disjoint with respect to a wide set of realistic faults, and requires a limited set of input code words for fault detection (thus it can be used to implement also embedded comparators)
Keywords :
CMOS logic circuits; VLSI; built-in self test; comparators (circuits); fault diagnosis; VLSI; embedded comparators; equality checker; fault detection; input code words; n-variable two-rail checker; self-checking n-input comparator; single output comparator; strongly code-disjoint; totally-self-checking; Aerospace electronics; Circuit faults; Circuit testing; Electrical fault detection; Error correction; Fault detection; Fault tolerant systems; Logic; Routing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-7810-0
DOI :
10.1109/VTEST.1997.600272
