• DocumentCode
    3043817
  • Title

    A 0.35 V, 100 MHz, 0.19 μW/MHz, 3-locking-cycle all digital delay locked loop with asynchronous-deskewing technology in 55 nm CMOS technology

  • Author

    Cheng, Chun-Yuan ; Wang, Jinn-Shyan ; Yeh, Cheng-Tai

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chung-Cheng Univ., Chiayi, Taiwan
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    19
  • Lastpage
    24
  • Abstract
    This paper presents an all digital delay-locked loop (ADDLL) that uses asynchronous-deskewing technology and achieves low power/voltage, small jitter, fast locking, and high process, voltage, and temperature (PVT)-variation tolerance. The measurement results show that the maximum frequency is 100 MHz at 0.35 V with 19μW power dissipation, 62 ps peak-to-peak jitter, and 3 locking cycles. When operated at 0.5 V, the measured maximal operating clock frequency is 450 MHz with 12 ps peak-to-peak jitter, 6 locking cycles, and 119μW power dissipation. The ADDLL is fabricated with 55nm CMOS technology, and the active area is only 0.019 mm2.
  • Keywords
    CMOS integrated circuits; delay lock loops; 3-locking-cycle all digital delay locked loop; CMOS technology; asynchronous-deskewing technology; frequency 100 MHz; power 119 muW; power 19 muW; size 55 nm; time 12 ps; time 62 ps; voltage 0.35 V; voltage 0.5 V; Clocks; Computer architecture; Delay; Delay lines; Detectors; Jitter; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits (ISIC), 2011 13th International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-61284-863-1
  • Type

    conf

  • DOI
    10.1109/ISICir.2011.6131870
  • Filename
    6131870