• DocumentCode
    3043884
  • Title

    Exact probabilistic analysis of error detection for parity checkers

  • Author

    Vardanian, V.A.

  • Author_Institution
    Armenian Nat. Academy of Sci., American Univ. of Armenia, Yerevan, Armenia
  • fYear
    1997
  • fDate
    27 Apr-1 May 1997
  • Firstpage
    222
  • Lastpage
    227
  • Abstract
    Error detection probability and latency of the parity checker with respect to single stuck-at faults in the circuit under check (CUC) are calculated analytically. A notion of “multi-output supergate” is introduced for multi-output combinational CUC generalizing the formerly known notion of (single-output) supergate. “Restricted” observabilities and detectabilities are calculated for each line in the CUC with respect to non-empty subsets of outputs of the CUC. The method may be easily extended for other concurrent checkers as well
  • Keywords
    combinational circuits; error detection; fault diagnosis; logic testing; parity; probability; circuit under check; combinational CUC; concurrent checker; error detection; latency; multi-output supergate; parity checker; probabilistic analysis; restricted detectability; restricted observability; single stuck-at fault; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Delay; Density measurement; Error analysis; Observability; Probability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1997., 15th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7810-0
  • Type

    conf

  • DOI
    10.1109/VTEST.1997.600276
  • Filename
    600276