DocumentCode
3043884
Title
Exact probabilistic analysis of error detection for parity checkers
Author
Vardanian, V.A.
Author_Institution
Armenian Nat. Academy of Sci., American Univ. of Armenia, Yerevan, Armenia
fYear
1997
fDate
27 Apr-1 May 1997
Firstpage
222
Lastpage
227
Abstract
Error detection probability and latency of the parity checker with respect to single stuck-at faults in the circuit under check (CUC) are calculated analytically. A notion of “multi-output supergate” is introduced for multi-output combinational CUC generalizing the formerly known notion of (single-output) supergate. “Restricted” observabilities and detectabilities are calculated for each line in the CUC with respect to non-empty subsets of outputs of the CUC. The method may be easily extended for other concurrent checkers as well
Keywords
combinational circuits; error detection; fault diagnosis; logic testing; parity; probability; circuit under check; combinational CUC; concurrent checker; error detection; latency; multi-output supergate; parity checker; probabilistic analysis; restricted detectability; restricted observability; single stuck-at fault; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Delay; Density measurement; Error analysis; Observability; Probability;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location
Monterey, CA
ISSN
1093-0167
Print_ISBN
0-8186-7810-0
Type
conf
DOI
10.1109/VTEST.1997.600276
Filename
600276
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