DocumentCode :
3045077
Title :
Synthesizable verification IP to stress test system-on-chip emulation and prototyping platforms
Author :
Shankar, Subramanian Shiva ; Shankar, Jayaratnam Siva
Author_Institution :
Lantiq Asia Pacific, Singapore, Singapore
fYear :
2011
fDate :
12-14 Dec. 2011
Firstpage :
609
Lastpage :
612
Abstract :
One of the biggest challenges today with Pre-silicon System-on-Chip verification is to stress out the SoC to uncover as many corner case design issues by injecting heavy real time data traffic into the system. The inherent efficiency and the performance of the Emulation and FPGA prototyping systems make them the ideal platforms to run these tests. A typical solution is to inject data traffic through protocol exercisers with proprietary hardware (vendor specific slow down solutions) which can bridge the emulated DUT with a real time device or use software API´s with transaction based SCE-MI communication infrastructure. The need for a complex input output interface makes the former difficult to be used with all emulators / FPGA prototyping systems while SCE-MI communication infrastructure being protocol specific is a disadvantage. So, a synthesizable verification architecture compliant with SCE-MI 2.0 infrastructure through which the protocol specific traffic is injected through industry standard interfaces. i.e. PIPE (PCIe), UTMI (USB), MII (Ethernet) based on user configured stimuli has been designed and implemented. Being synthesizable, the verification environment can run in both emulation and prototyping platforms effectively stress testing the complete system.
Keywords :
field programmable gate arrays; formal verification; industrial property; peripheral interfaces; system-on-chip; DUT; FPGA prototyping systems; PIPE; SCE-MI 2.0 infrastructure; SCE-MI communication infrastructure; UTMI; data traffic; device under test; pre-silicon system-on-chip verification; protocol exercisers; stress test; synthesizable verification IP; verification architecture compliant; verification environment; Computer architecture; Emulation; Hardware; Protocols; Software; Stress; System-on-a-chip; PIPE; SCE-MI; Stress Testing; UTMI;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-61284-863-1
Type :
conf
DOI :
10.1109/ISICir.2011.6131936
Filename :
6131936
Link To Document :
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