• DocumentCode
    3045319
  • Title

    Five-beam Interference Pattern Model for laser interference lithography

  • Author

    Deng, Xiangying ; Hu, Zhen ; Xiu, Guowei ; Li, Dayou ; Yue, Yong ; Song, Zhengxun ; Weng, Zhankun ; Xu, Jia ; Wang, Zuobin

  • Author_Institution
    Inst. of Phys., Jilin Univ., Changchun, China
  • fYear
    2010
  • fDate
    20-23 June 2010
  • Firstpage
    1208
  • Lastpage
    1213
  • Abstract
    Laser interference lithography (LIL) is an established fabrication technology for micro and nano scale structuring of periodic and quasi-periodic surface patterns. This paper presents a Five-beam Interference Pattern Model for laser interference lithography. It can be programmed to obtain images of interference results showing interference intensity distributions. The majority of 2-5 beam interference patterns can be simulated by this model with every variable in an LIL system. In this work, different technologies for nano structuring are introduced, along with the principle of the five-beam interference pattern model. Several images of interference results obtained by the five-beam interference pattern model are shown and some of their possible applications are discussed. Three-beam interference patterns and five-beam interference patterns are formed using a laser beam that goes along the z axis which is not used commonly in other LIL models.
  • Keywords
    laser beam applications; lithography; microfabrication; nanofabrication; nanopatterning; fabrication technology; five-beam interference pattern model; interference intensity distributions; laser interference lithography; nanostructuring; quasiperiodic surface patterns; Atomic beams; Electron beams; Interference; Laser modes; Laser theory; Lithography; Magnetic materials; Optical device fabrication; Optical surface waves; Ultraviolet sources; five-beam interference pattern model; laser interference lithography; nano patterning; nano structuring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information and Automation (ICIA), 2010 IEEE International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-5701-4
  • Type

    conf

  • DOI
    10.1109/ICINFA.2010.5512128
  • Filename
    5512128