• DocumentCode
    3045347
  • Title

    Design optimization of MOS operational amplifiers using finite difference sensitivity

  • Author

    Weng, Binbin ; Shi, Guoyong

  • Author_Institution
    Sch. of Microelectron., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    277
  • Lastpage
    280
  • Abstract
    MOS analog circuit sizing is considered a highly complex task that requires experience and skills. Many methods proposed in the literature have arguable merits and limitations; none of them has become a widely recognized method being adopted in the design practice. This paper attempts to use a simply computable metric called the finite difference sensitivity computed mainly in the ac domain for the purpose of device sizing. Multiple design goals are formulated as a weighted optimization objective function and a gradient search is developed for optimizing the objective function. All constraints are subsumed in the objective function in the form of penalty functions. Experimental results show that such a simple formulation of circuit optimization is capable of finding satisfactory suboptimal sizing results which can be used for subsequent manual tuning or layout reference. The automated sizing procedure is compared to manual sizing and is demonstrated that the auto-sizing scheme has a better capability in balancing the multiple design objectives.
  • Keywords
    MOS analogue integrated circuits; circuit optimisation; finite difference methods; gradient methods; integrated circuit design; operational amplifiers; MOS analog circuit sizing; MOS operational amplifiers; ac domain; automated sizing procedure; circuit optimization; design optimization; device sizing; finite difference sensitivity; gradient search; layout reference; manual sizing; manual tuning; penalty functions; satisfactory suboptimal sizing; weighted optimization objective function; Analog circuits; Design automation; MOSFET circuits; Manuals; Optimization; Sensitivity; MOS operational amplifier; analog design automation; finite-difference sensitivity; optimization; sizing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits (ISIC), 2011 13th International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-61284-863-1
  • Type

    conf

  • DOI
    10.1109/ISICir.2011.6131950
  • Filename
    6131950