Title :
1993 IEEE Radiation Effects Data Workshop
Abstract :
The following topics were dealt with: SEE susceptibility; SEV and latch-up; heavy ion testing; proton irradiation testing; memory testing; microprocessor testing; logic testing; spaceflight SEV data; dielectric charging; total ionizing dose effects
Keywords :
CMOS integrated circuits; computer testing; digital integrated circuits; integrated circuit testing; logic testing; radiation effects; radiation hardening (electronics); semiconductor device testing; CMOS circuits; SEE susceptibility; SEV; dielectric charging; electronic devices; heavy ion testing; latch-up; logic testing; memory testing; microprocessor testing; proton irradiation testing; radiation effects; single-event effects; single-event upset; spaceflight SEV data; total ionizing dose effects;
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Conference_Location :
Snowbird, UT, USA
Print_ISBN :
0-7803-1906-0
DOI :
10.1109/REDW.1993.700560
