DocumentCode
3045589
Title
Wafer Scale Encapsulation of Large Lateral Deflection MEMS Structures
Author
Graham, A.B. ; Messana, M. ; Hartwell, P. ; Provine, J. ; Yoneoka, S. ; Kim, B. ; Melamud, R. ; Howe, R.T. ; Kenny, T.W.
Author_Institution
Stanford Univ., Stanford, CA
fYear
2009
fDate
25-29 Jan. 2009
Firstpage
745
Lastpage
748
Abstract
Packaging of microelectromechanical systems (MEMS) is a critical step in the transition from product development to production. This paper presents a robust, hermetically-sealed encapsulation method that can accommodate many traditional MEMS devices by allowing large lateral deflection structures within a clean environment. Using the new technology described in this paper, trench widths ranging from 1 mum to 100 mum were successfully encapsulated at the wafer level while maintaining devices as thick as 20 mum. Devices produced with this method have proven durable enough to withstand harsh post-processing such as dicing and wire bonding. Two different types of MEMS resonators are also discussed, demonstrating the use of both large and small trench widths within the encapsulation.
Keywords
encapsulation; hermetic seals; lead bonding; micromechanical resonators; wafer level packaging; MEMS resonator; dicing; hermetic seal; lateral deflection structures; microelectromechanical systems; packaging; size 1 mum to 100 mum; wafer scale encapsulation; wire bonding; Encapsulation; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Packaging; Product development; Production systems; Robustness; Wafer bonding; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2009. MEMS 2009. IEEE 22nd International Conference on
Conference_Location
Sorrento
ISSN
1084-6999
Print_ISBN
978-1-4244-2977-6
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2009.4805490
Filename
4805490
Link To Document