Determination of coherence errors in ADC spectral domain testing

Author

Bartlett, W.D.

Author_Institution

Data Acquistion Products Test Engineer, FL, USA

fYear

1997

fDate

27 Apr-1 May 1997

Firstpage

308

Lastpage

313

Abstract

Coherence of the input and clock frequencies input to an analog-to-digital converter (ADC) during the spectral domain based effective number of bits (ENOB) test is desirable in order to achieve reproducible results without resorting to windowing functions. Impact of these errors on the ENOB test of an ADC is first discussed. A simple model of an ADC used to test the effect of coherence is given. Then this paper presents a method to detect and measure these coherence errors. The ADC model is used to demonstrate this method. Experimental results applied to a 10-bit 40 MSPS converter with a 10 MHz input sinewave are also presented

Keywords

analogue-digital conversion; coherence; integrated circuit testing; measurement errors; 10 MHz; 10 bit; ADC spectral domain testing; analog-to-digital converter; clock frequencies input; coherence errors; effective number of bits test; spectral domain based test; Analog-digital conversion; Clocks; Coherence; Fourier series; Frequency conversion; Frequency domain analysis; Frequency measurement; Noise measurement; Power measurement; Semiconductor device testing;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1997., 15th IEEE

Conference_Location

Monterey, CA

ISSN

1093-0167

Print_ISBN

0-8186-7810-0

Type

conf

DOI

10.1109/VTEST.1997.600294

Filename

600294