DocumentCode :
3047394
Title :
Integrated scheme for high impedance fault detection in MV distribution system
Author :
Cui, Tao ; Dong, Xinzhou ; Bo, Zhiqian ; Richards, Simon
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing
fYear :
2008
fDate :
13-15 Aug. 2008
Firstpage :
1
Lastpage :
6
Abstract :
High impedance fault (HIF) in MV distribution with restricted fault current cannot be detected and cleared by conventional overcurrent relays. HIF exposes great hazard for personal safety and property security. In this paper, an integrated scheme utilizing different features of HIF is presented. Various documented field data has been investigated and summarized to get the most distinctive features of HIF. Based on these features, a simulation model using arc thermal equation and random factor has been developed. The integrated scheme investigates into different scopes of the fault features ranging from transient high frequency, harmonic distortion to fundamental intermittent. EMTP (Electromagnetic Transients Program) simulation results show that the integrated scheme can detect most HIFs, and discriminate HIF from other interference scenarios such as CT saturation, load nonlinearity and capacity transients. Therefore, this scheme achieves a better result with reliability and security.
Keywords :
EMTP; arcs (electric); fault currents; fault diagnosis; overcurrent protection; power distribution faults; power distribution reliability; power system analysis computing; power system relaying; Electromagnetic Transients Program; MV distribution system; arc thermal equation; high impedance fault detection; medium voltage distribution system; overcurrent relays; personal safety; property security; random factor; Data security; EMTP; Electromagnetic transients; Fault currents; Fault detection; Hazards; Impedance; Relays; Safety; Thermal factors; EMTP; Harmonic; High Impedance Fault; Intermittent; Wavelet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exposition: Latin America, 2008 IEEE/PES
Conference_Location :
Bogota
Print_ISBN :
978-1-4244-2217-3
Electronic_ISBN :
978-1-4244-2218-0
Type :
conf
DOI :
10.1109/TDC-LA.2008.4641708
Filename :
4641708
Link To Document :
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