Defect-induced electrical signals in solid dielectric power cable and implications thereof for defect location

Author

Kuang, Jinbo ; Boggs, Steven

Author_Institution

Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada

Volume

1

fYear

1996

fDate

20-23 Oct 1996

Firstpage

86

Abstract

When a surge is applied to a solid dielectric cable with a stress-enhancement-containing defect, the current which flows to produce a field-limiting space charge surrounding the defect generates a signal on the conductor of the cable. Based on transient, nonlinear finite element computations of the defect-induced current, we predict the nature of this signal as a function of the applied surge waveform and defect severity, and we investigate implications for defect location during a factory cable reel test

Keywords

XLPE insulation; fault location; finite element analysis; flaw detection; insulation testing; power cable insulation; power cable testing; signal detection; space charge; surges; transient analysis; waveform analysis; 230 kV; XLPE; applied surge waveform; cable conductor signal; defect location; defect severity; defect-induced current; defect-induced electrical signals; factory cable reel test; field-limiting space charge; resistive current; solid dielectric power cable; stress-enhancement-containing defect; terminal current; transient nonlinear finite element computations; Conductors; Dielectrics; Finite element methods; Power cables; Production facilities; Signal generators; Solids; Space charge; Surges; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on

Conference_Location

Millbrae, CA

Print_ISBN

0-7803-3580-5

Type

conf

DOI

10.1109/CEIDP.1996.564600

Filename

564600