Title :
A novel method for surface charge density measurement
Author :
Ping, Zhang ; Kaixi, Zhang
Author_Institution :
Dept. of Phys., Hebei Normal Univ., China
Abstract :
In this paper, a new method for measuring surface charge density by means of Pockels effect and optic phase compensation is presented. Totally different from current measuring methods, this new measuring probe is made of Pockels crystal and the principle of the measurement is based on optical phase compensation. This problem brings much less disturbance to the surface charge density, especially, one on a conductor surface and the measuring result is easily obtained by readings from a voltmeter
Keywords :
Pockels effect; charge measurement; probes; surface charging; Pockels effect; conductor surface; optical phase compensation; probes; surface charge density measurement; Charge measurement; Conductors; Current measurement; Density measurement; Dielectric measurements; Electric variables measurement; Electrostatic measurements; Optical devices; Phase measurement; Surface discharges;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
DOI :
10.1109/CEIDP.1996.564609
