• DocumentCode
    3051654
  • Title

    On tracking and erosion resistance of high temperature vulcanizing silicone rubber

  • Author

    Schmidt, Lars E. ; Kornmann, Xavier ; Hillborg, Henrik ; Krivda, Andrej

  • Author_Institution
    Corp. Res., ABB Switzerland Ltd., Baden-Daettwil, Switzerland
  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    23
  • Lastpage
    25
  • Abstract
    High temperature vulcanizing silicone rubber is highly filled with aluminium trihydrate (ATH, Al2O3·3H2O) to assure UL-94 VO rating (insulation is self-extinguishing). Different simultaneous mechanisms, including the release of chemically bound water are responsible for the efficient flame retarding and smoke suppressing effect of ATH. In ATH containing silicone rubber samples occasionally tracking occurs, often accompanied by deep erosion patterns. In this study the effect of different halogen free flame retardant additives on tracking and erosion behaviour was studied. Amongst these, melamine cyanurate led to UL-94 VO in combination with a significantly improved tracking and erosion resistance. Measurements of dielectric loss and permittivity indicated that melamine cyanurate does not alter the electrical properties of silicone rubber considerably.
  • Keywords
    dielectric losses; permittivity; silicone rubber insulators; vulcanisation; aluminium trihydrate; deep erosion patterns; dielectric loss; erosion resistance; flame retardant additives; high temperature vulcanizing silicone rubber; melamine cyanurate; permittivity; silicone rubber insulators; Additives; Aluminum; Chemicals; Dielectric loss measurement; Electric resistance; Fires; Flame retardants; Insulation life; Rubber; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
  • Conference_Location
    Virginia Beach, VA
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-4557-8
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2009.5377791
  • Filename
    5377791