Title :
Optimisation of near-field optical probes
Author :
Libenson, M.N. ; Zhdanov, G.S.
Author_Institution :
State Res. Center, Vavilov (S.I.) State Opt. Inst., St. Petersburg, Russia
Abstract :
The most important part of a scanning near-field optical microscope (SNOM) is an optical probe that is scanned along the object at a very small distance. The probe tip is usually the tapered end of an optical monomode fiber. In various types of SNOM tips with and without metal coating are: utilized. In the aperture SNOM (a-SNOM) the tip is overcoated by a metal except for a small aperture at the apex. In the photon scanning tunneling microscope (PSTM) the bare quartz tip is used to detect the evanescent field near the sample.
Keywords :
metallic thin films; optical fibres; optical microscopy; optical resolving power; optimisation; scanning tunnelling microscopy; SNOM tips; aperture SNOM; bare quartz tip; evanescent field detection; metal coating; near-field optical probe optimisation; optical monomode fiber; optical probe; optical resolving power; overcoated; photon scanning tunneling microscope; probe tip; small aperture; tapered end; very small distance; Aluminum; Apertures; Coatings; Magnetic separation; Optical attenuators; Optical microscopy; Optical scattering; Optical surface waves; Probes; Rough surfaces;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
DOI :
10.1109/LEOS.1996.565109
