DocumentCode :
3051892
Title :
Processor-core based design and test
Author :
Marwedel, Peter
Author_Institution :
Dortmund Univ., Germany
fYear :
1997
fDate :
28-31 Jan 1997
Firstpage :
499
Lastpage :
502
Abstract :
This paper responds to the rapidly increasing use of various cores for implementing systems-on-a-chip. It specifically focusses on processor cores. We give some examples of cores, including DSP cores and application-specific instruction-set processors (ASIPs). We mention market trends for these components, and we touch design procedures, in particular the use of compilers. Finally, we discuss the problem of testing core-based designs. Existing solutions include boundary scan, embedded in-circuit emulation (ICE), the use of processor resources for stimuli/response compaction and self-test programs
Keywords :
application specific integrated circuits; circuit CAD; circuit analysis computing; logic testing; DSP cores; application-specific instruction-set processors; boundary scan; compilers; design procedures; embedded in-circuit emulation; processor cores; processor-core based design and test; self-test programs; stimuli/response compaction; systems-on-a-chip; Application specific processors; Automotive electronics; Built-in self-test; Compaction; Digital signal processing; Embedded system; Emulation; Ice; Process design; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the ASP-DAC '97 Asia and South Pacific
Conference_Location :
Chiba
Print_ISBN :
0-7803-3662-3
Type :
conf
DOI :
10.1109/ASPDAC.1997.600316
Filename :
600316
Link To Document :
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