Title :
Construction of M-PSK trellis codes and performance analysis over fading channels
Author :
Vucetic, Branka ; Nicolas, Julien
Author_Institution :
Sydney Univ., NSW, Australia
Abstract :
By using derived analytical bounds, the authors show that to minimize the error probability of MPSK TCM (trellis coded modulation) codes on fading channels the free Euclidean distance should be maximized for large ECL (effective code length) codes. For short ECLs, however, the ECL and the minimum PD (product distance) are used as the design criteria to obtain better codes than corresponding Ungerboeck codes. By using a simulation method, it is shown that the code performance is extremely sensitive to interleaving depths and that the penalty due to nonideal interleaving is high. The results also indicate much less sensitivity of trellis codes to decoding decision depths on fading channels than on Gaussian channels, allowing higher interleaving degrees on delay-constrained communication systems. Error performance bounds are derived for MPSK trellis codes over Gaussian and fading channels in the presence of phase noise. Coherent demodulation combined with the transparent tone in band technique (TTIB) for phase recovery is evaluated
Keywords :
codes; fading; phase shift keying; telecommunication channels; Gaussian channels; MPSK trellis codes; analytical bounds; code performance; coherent demodulation; decoding decision depths; delay-constrained communication systems; design; effective code length; error performance bounds; error probability; fading channels; free Euclidean distance; interleaving depths; performance analysis; phase noise; phase recovery; product distance; simulation method; transparent tone in band technique; trellis coded modulation; Convolutional codes; Decoding; Delay systems; Error probability; Euclidean distance; Fading; Gaussian channels; Interleaved codes; Modulation coding; Performance analysis;
Conference_Titel :
Communications, 1990. ICC '90, Including Supercomm Technical Sessions. SUPERCOMM/ICC '90. Conference Record., IEEE International Conference on
Conference_Location :
Atlanta, GA
DOI :
10.1109/ICC.1990.117152