• DocumentCode
    305217
  • Title

    Study of near-field propagating mode profiles and waveguide structures of optical fibers

  • Author

    Tsai, Din Ping ; Li, Wen Kai

  • Author_Institution
    Dept. of Phys., Nat. Chung Cheng Univ., Chia Yi, China
  • Volume
    1
  • fYear
    1996
  • fDate
    18-21 Nov. 1996
  • Firstpage
    115
  • Abstract
    A novel method using SNOM and AFM to study both optical fiber structures and near-field optical intensity profiles at fiber endfaces has been successfully developed. We have demonstrated that this novel technique is able to probe both refractive index distribution and near-field propagating intensity profile of fiber structures simultaneously. Correlations between waveguide structures and near-field propagating modes can be acquired directly from the experimental images.
  • Keywords
    atomic force microscopy; optical dispersion; optical fibre testing; optical microscopy; refractive index; AFM; SNOM; fiber endfaces; near-field optical intensity profiles; near-field propagating mode profiles; optical fibers; refractive index distribution; waveguide structures; Etching; Optical fiber polarization; Optical fibers; Optical propagation; Optical refraction; Optical saturation; Optical variables control; Optical waveguides; Probes; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-3160-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1996.565152
  • Filename
    565152