DocumentCode
305217
Title
Study of near-field propagating mode profiles and waveguide structures of optical fibers
Author
Tsai, Din Ping ; Li, Wen Kai
Author_Institution
Dept. of Phys., Nat. Chung Cheng Univ., Chia Yi, China
Volume
1
fYear
1996
fDate
18-21 Nov. 1996
Firstpage
115
Abstract
A novel method using SNOM and AFM to study both optical fiber structures and near-field optical intensity profiles at fiber endfaces has been successfully developed. We have demonstrated that this novel technique is able to probe both refractive index distribution and near-field propagating intensity profile of fiber structures simultaneously. Correlations between waveguide structures and near-field propagating modes can be acquired directly from the experimental images.
Keywords
atomic force microscopy; optical dispersion; optical fibre testing; optical microscopy; refractive index; AFM; SNOM; fiber endfaces; near-field optical intensity profiles; near-field propagating mode profiles; optical fibers; refractive index distribution; waveguide structures; Etching; Optical fiber polarization; Optical fibers; Optical propagation; Optical refraction; Optical saturation; Optical variables control; Optical waveguides; Probes; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-3160-5
Type
conf
DOI
10.1109/LEOS.1996.565152
Filename
565152
Link To Document