• DocumentCode
    305233
  • Title

    Second-harmonic generation in semiconductors: devices and diagnostics

  • Author

    Janz, S.

  • Author_Institution
    Inst. for Microstructural Sci., Nat. Res. Council of Canada, Ottawa, Ont., Canada
  • Volume
    1
  • fYear
    1996
  • fDate
    18-21 Nov. 1996
  • Firstpage
    152
  • Abstract
    This presentation will review recent efforts to understand the second-order nonlinearity in bulk semiconductors and quantum wells, and at semiconductor interfaces. Optical second-harmonic generation has found increasing application in semiconductor science and technology in 1980s/1990s. One of the reasons for this is the development of quasi-phase matching techniques, which have revolutionized the field of nonlinear optical frequency mixing. Periodically modulating the optical properties of a material, for example along a waveguide, results in a quasiphase matched (QPM) geometry with SH generation efficiencies approaching that of conventional phase matched geometries.
  • Keywords
    integrated optics; laser tuning; measurement by laser beam; optical harmonic generation; optical testing; optical waveguides; semiconductor device testing; semiconductor quantum wells; spectroscopy; SH generation efficiencies; bulk semiconductors; conventional phase matched geometries; nonlinear optical frequency mixing; optical properties; optical second-harmonic generation; periodically modulating; quantum wells; quasi-phase matching techniques; quasiphase matched geometry; review; second-harmonic generation; second-order nonlinearity; semiconductor interfaces; semiconductor science; semiconductors; Frequency; Geometrical optics; Materials science and technology; Nonlinear optical devices; Nonlinear optics; Optical materials; Optical mixing; Optical modulation; Optical waveguides; Phase modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-3160-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1996.565170
  • Filename
    565170