• DocumentCode
    305258
  • Title

    Measurement of laser parameters of a vertical-cavity surface-emitting laser using an external mirror

  • Author

    Ha, K.H. ; Lee, Y.-H.

  • Author_Institution
    Dept. of Phys., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
  • Volume
    1
  • fYear
    1996
  • fDate
    18-21 Nov. 1996
  • Firstpage
    213
  • Abstract
    The threshold gain and the cavity loss are important parameters for the optimum design of vertical-cavity surface-emitting lasers (VCSEL). Here we try to determine the cavity loss by varying the amount of light fed back to the VCSEL using an external mirror. The tested VCSEL consists of a superlattice active region surrounded by AlAs/Al/sub 0.3/Ga/sub 0.7/As distributed Bragg reflectors. The nonlinear gain effect is introduced in estimating the internal parameters of VCSELs. Since most VCSELs operate at a carrier density much higher than the transparency level, the nonlinear gain effect should be nonnegligible and be considered. Therefore, this method is appropriate even for a large threshold-gain (like the VCSEL) and/or a large amount of the feedback light (more than a few percents).
  • Keywords
    carrier density; distributed Bragg reflector lasers; gain measurement; laser cavity resonators; laser mirrors; laser variables measurement; optical loss measurement; quantum well lasers; surface emitting lasers; AlAs-Al/sub 0.3/Ga/sub 0.7/As; AlAs/Al/sub 0.3/Ga/sub 0.7/As distributed Bragg reflectors; VCSEL; carrier density; cavity loss; external mirror; feedback light; internal parameters; laser parameters measurement; nonlinear gain effect; optimum design; superlattice active region; threshold gain; transparency level; vertical-cavity surface-emitting laser; Charge carrier density; Distributed Bragg reflectors; Feedback; Mirrors; Optical design; Parameter estimation; Superlattices; Surface emitting lasers; Testing; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-3160-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1996.565203
  • Filename
    565203