• DocumentCode
    305287
  • Title

    Time resolved spectra study of GaN light emitting diodes (LEDs)

  • Author

    Choa, F.S. ; Fan, J.Y. ; Liu, P.L. ; Sipior, J. ; Rao, G. ; Carter, G.M. ; Chen, Y.J.

  • Author_Institution
    Dept. of Comput. Sci., Maryland Univ., Baltimore, MD, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    18-21 Nov. 1996
  • Firstpage
    278
  • Abstract
    We study time-resolved-spectra of InGaN and GaN diodes with a short electrical pulse. LEDs with four different structures were studied: the bulk InGaN/GaN blue LED (/spl lambda//sub peak/ = 450 nm); the InGaN single quantum well (SQW) blue LED (/spl lambda//sub peak/ = 470 nm); the InGaN SQW green LED (/spl lambda//sub peak/ = 525 nm); and the Zn disordered GaN active layer (/spl lambda//sub peak/ = 430 nm). When pumped with short electrical pulses, some of them can generate UV light. The electrical pump time-resolved spectrum studies provide a convenient tool to investigate the recombination process in the GaN material system. The results show that the UV emissions from bulk GaN and bulk InGaN materials, and the blue as well as the green emissions from the high efficiency InGaN SQW LEDs, correspond to bandedge transitions.
  • Keywords
    III-V semiconductors; gallium compounds; indium compounds; light emitting diodes; semiconductor quantum wells; time resolved spectra; 430 nm; 450 nm; 470 nm; 525 nm; GaN; GaN light emitting diodes; InGaN; InGaN SQW green LED; InGaN single quantum well blue LED; LED; UV light; Zn disordered GaN active layer; bandedge transitions; bulk InGaN/GaN blue LED; electrical pump time-resolved spectrum; high efficiency; recombination process; short electrical pulse; time-resolved-spectra; Aluminum gallium nitride; Gallium nitride; Light emitting diodes; Optical pulse generation; Optical pulses; Probability distribution; Pulse generation; Radiative recombination; Ultrafast optics; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-3160-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1996.565239
  • Filename
    565239