DocumentCode :
3052953
Title :
Salvaging test windows in BIST diagnostics
Author :
Savir, Jacob
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
fYear :
1997
fDate :
27 Apr-1 May 1997
Firstpage :
416
Lastpage :
425
Abstract :
This paper uses the STUMPS architecture to study the properties of a new diagnostic procedure. According to the old procedure the process stops at the end of each test window to compare the measured signature against its precomputed value. The old procedure also calls for the abandonment of all future test windows after the first failing one is encountered. This is due to the unavailability of expected future test window signatures in the presence of a previously captured error. This paper shows a simple method of salvaging future test windows by adjusting their expected signatures to fit past observed errors. Experiments conducted using this new procedure reveals an improvement of at least one order of magnitude in diagnostic resolution over what has been previously experienced
Keywords :
built-in self test; BIST diagnostics; STUMPS architecture; signature measurement; test window; Built-in self-test; Design methodology; Failure analysis; Fault detection; Fault diagnosis; Jacobian matrices; Logic testing; Registers; Sequential analysis; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
ISSN :
1093-0167
Print_ISBN :
0-8186-7810-0
Type :
conf
DOI :
10.1109/VTEST.1997.600321
Filename :
600321
Link To Document :
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