DocumentCode :
3052974
Title :
Quasi-ballistic transport in nanowire field-effect transistors
Author :
Baccarani, Giorgio ; Gnani, Elena ; Gnudi, Antonio ; Reggiani, Susanna
Author_Institution :
Dept. of Electron., Univ. of Bologna, Bologna
fYear :
2008
fDate :
9-11 Sept. 2008
Firstpage :
5
Lastpage :
8
Abstract :
In this work we investigate quasi-ballistic transport in nanowire field-effect transistors (NW-FETs) by addressing the 1D Boltzmann transport equation. First, we find its exact analytical solution for any potential profile within the constraint of dominant elastic scattering. Next, we calculate the I-V characteristics of the NW-FET, which differ from the Landauer expression for the inclusion of a transmission coefficient smaller than one. Our approach provides a methodology for the calculation of the transmission and backscattering coefficients directly from the scattering probabilities. These coefficients turn out to be functions of the ratio between the device length and a suitably-averaged momentum-relaxation distance. One of the main conclusions of the paper is that, so long as inelastic collisions are neglected, the so-called kT-layer plays no role in 1D devices.
Keywords :
Boltzmann equation; ballistic transport; field effect transistors; nanowires; Boltzmann transport equation; I-V characteristics; Landauer expression; backscattering coefficient calculation; dominant elastic scattering; inelastic collisions; nanowire field-effect transistors; quasi-ballistic transport; scattering probabilities; suitably-averaged momentum-relaxation distance; transmission coefficient calculation; Backscatter; Boltzmann equation; Distribution functions; FETs; MOSFETs; Monte Carlo methods; Optical scattering; Probability; Schrodinger equation; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
Conference_Location :
Hakone
Print_ISBN :
978-1-4244-1753-7
Type :
conf
DOI :
10.1109/SISPAD.2008.4648223
Filename :
4648223
Link To Document :
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