Title :
Formulation-level design space exploration for partially reconfigurable FPGAs
Author :
Kumar, Rohit ; Gordon-Ross, Ann
Author_Institution :
NSF Center for High-Performance Reconfigurable Comput. (CHREC), Univ. of Florida, Gainesville, FL, USA
Abstract :
Exploiting the benefits afforded by runtime partial reconfiguration (PR) on modern field-programmable gate arrays (FPGAs)requires PR-capable applications and associated PR-architectures, both of which are challenging tasks due to competing implementation metrics(e.g., area, power, operating frequency, etc.) and results in unmanageable design spaces. PR design space exploration (DSE) techniques and tools assist designers in efficiently and effectively exploring this design space. This paper presents the first, to the best of our knowledge, formulation-level PR DSE tool - FoRSE. FoRSE leverages the application´s PR-architecture and mathematical FPGA device models and vendor-specified PR technology to generate Pareto-optimal sets of PR-floorplans and devices based on designer-designated implementation metrics. FoRSE can prune an application´s implementation design space by three to four orders of magnitude in approximately 15 seconds.
Keywords :
Pareto optimisation; field programmable gate arrays; integrated circuit layout; logic design; mathematical analysis; reconfigurable architectures; FoRSE; PR-floorplans; Pareto-optimal sets; field programmable gate arrays; formulation-level PR DSE tool; formulation-level design space exploration technique; mathematical FPGA device models; partially reconfigurable FPGA; runtime partial reconfiguration; unmanageable design spaces; vendor-specified PR technology; Algorithm design and analysis; Digital signal processing; Field programmable gate arrays; Mathematical model; Measurement; Probes; Space exploration; FPGA; design space exploration; floorplanning; partial reconfiguration; resource saving;
Conference_Titel :
Field-Programmable Technology (FPT), 2011 International Conference on
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1741-3
DOI :
10.1109/FPT.2011.6132699