DocumentCode :
3053918
Title :
Comprehensive Study of Epoxy Die Attach Process to Achieve Zero Reject Performance
Author :
Sinn, Lee Yee ; Eng, Tan Chee
Author_Institution :
ON Semicond., Seremban
fYear :
2007
fDate :
8-10 Nov. 2007
Firstpage :
230
Lastpage :
235
Abstract :
The epoxy die attach is one of the most preferred methods in mounting die on leadframe / substrate, mainly due to its flexibility and cost effectiveness. In a critical package called FETChip, several challenges occurred in the die attach process, due to upset flag/post, flag size smaller than die size, and small gap from flag to post leads. A comprehensive study performed in optimizing epoxy dispensing capability, from determining basic critical conditions, nozzle design, clamp design, idling effect, dispensing parameters, placement, pattern recognition, new machine features, until achieving six sigma process controls in epoxy performance.
Keywords :
chip scale packaging; field effect integrated circuits; microassembling; six sigma (quality); FETChip; clamp design; epoxy die attach process; epoxy dispensing capability; leadframe; mounting die; nozzle design; six sigma process controls; substrate; zero reject performance; Assembly; Bonding; Electronics industry; Industrial electronics; Manufacturing processes; Microassembly; Packaging; Semiconductor device manufacture; Six sigma; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location :
Petaling Jaya
ISSN :
1089-8190
Print_ISBN :
978-1-4244-0730-9
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2006.4456459
Filename :
4456459
Link To Document :
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