Title :
Plenary presentations: Keynote: The product complexity and test — How product complexity impacts test industry
Author :
Campbell, Michael
Author_Institution :
Qualcomm
Abstract :
Summary form only given. One of the driving forces behind the semiconductor industry has been Moore´s law. In abstract Moore´s law says the number of transistors per square inch on integrated circuits will double every 18 months. Doubling transistor count in rough approximation doubles complexity. To keep the same cost, yield at the new process node must be similar to the previous node. Further, to maintain the cost of test as a percentage of AUC, then test time per transistor or cost of test per second have to be reduced by 50% in the same time lines. The research and development driven in yield management, tester development, test development and DFT have allowed an ongoing cost profile that allows for economic profile required to sustain semiconductor expansion. This talk will explore both historical and real time issues related to complexity and the test industry.
Keywords :
circuit complexity; integrated circuit testing; semiconductor industry; transistors; Moore law; circuit complexity; integrated circuit testing; product complexity; semiconductor industry; test industry; transistor; Automatic testing; Circuit testing; Costs; Design engineering; Design optimization; Engineering management; Foundries; Moore´s Law; Multiaccess communication; Semiconductor device testing;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512791