Abstract :
The following topics are dealt with: reliable, self-testing, self-tuning devices; converter testing; lab-on-chip test issues; statistical learning for test and diagnosis; test circuitry on interface boards and ATE; MEMS testing; reliability and concurrent error detection; and testing new types of devices.
Keywords :
electronic equipment testing; reliability; ATE; MEMS testing; concurrent error detection; converter testing; interface boards; lab-on-chip test; reliability detection; self-testing devices; self-tuning devices; statistical learning; test circuitry;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2011 IEEE 17th International
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-1-4577-1144-2
DOI :
10.1109/IMS3TW.2011.1
