DocumentCode :
3055535
Title :
Characteristics of InAs quantum dot superluminescent diodes utilizing trench structures
Author :
Yoo, Young Chae ; Han, Il Ki ; Lee, Jung Il ; Lee, Joo In ; Kim, Eun Kyu
Author_Institution :
Nano Device Res. Center, Korea Inst. of Sci. & Technol., Seoul, South Korea
fYear :
2009
fDate :
9-11 Dec. 2009
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, the trench structure of J-shaped superluminescent diodes (SLDs) was utilized in order to avoid optical power loss with week index waveguides. Electroluminescence (EL) were measured with the increase of injection current. The EL peaks were normalized to the peak intensity of the ground state. Without trench structure the increase in peak intensity of the excited state would not have occurred. It was believed that the SLDs optical power increase was closely related to the increase of the intensity peak at excited state.
Keywords :
III-V semiconductors; electroluminescence; electroluminescent devices; excited states; ground states; indium compounds; semiconductor quantum dots; superluminescent diodes; InAs; electroluminescence; excited state; ground state; injection current; optical power loss; peak intensity; quantum dot superluminescent diodes; trench structures; week index waveguides; Current measurement; Diode lasers; Educational institutions; Etching; Fabry-Perot; Optical microscopy; Optical waveguides; Quantum dots; Stimulated emission; Superluminescent diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2009. ISDRS '09. International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4244-6030-4
Electronic_ISBN :
978-1-4244-6031-1
Type :
conf
DOI :
10.1109/ISDRS.2009.5378085
Filename :
5378085
Link To Document :
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