Title :
A novel switched-capacitor capacitance-to-digital converter for single element capacitive sensors
Author :
Sreenath, V. ; George, Boby
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India
Abstract :
A capacitance-to-digital converter (CDC) that gives a digital value proportional to the change in the capacitance of a sensor, independent of its nominal capacitance, is presented in this paper. The CDC presented is suitable for single element capacitive sensors. For most of the CDCs, available in the market, the output depends on the nominal value of the sensor. Thus, a manual intervention for appropriate correction in the output is required whenever a new sensor is connected to such CDCs. The proposed CDC uses a simple automatic calibration, employing a digitally controlled reference voltage in a feedback topology, and provides an output independent of the nominal value of the sensor employed. This automatic calibration also removes the dependence on the accuracy of the absolute value of reference capacitor, in the final output. The proposed CDC is based on a switched-capacitor dual-slope technique and possesses the advantages of the dual-slope conversion method. A prototype CDC has been developed and the test results are presented. The results obtained show that the output of the proposed converter is not a function of the nominal capacitance of the sensor for a wide range (50 pF to 1.15 nF). For this range, the worst error noted from the prototype CDC was less than 0.65 %.
Keywords :
analogue-digital conversion; capacitive sensors; switched capacitor networks; automatic calibration; capacitance 50 pF to 1.15 nF; digitally controlled reference voltage; dual slope conversion method; feedback topology; single element capacitive sensors; switched capacitor capacitance-to-digital converter; switched capacitor dual slope technique; Calibration; Capacitance; Capacitive sensors; Capacitors; Clocks; Potentiometers; Radio frequency; Capacitance-to-digital converter (CDC); automatic calibration; digital potentiometer; offset capacitance;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151298