• DocumentCode
    3061111
  • Title

    Reverse Engineering Abstract Components for Model-Based Development and Verification of Embedded Software

  • Author

    Choi, Yunja ; Jang, Hoon

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Coll. of IT Kyungpook Nat. Univ., Daegu, South Korea
  • fYear
    2010
  • fDate
    3-4 Nov. 2010
  • Firstpage
    122
  • Lastpage
    131
  • Abstract
    Model-driven development (MDD) and verification approaches are highly desirable in the development of (safety-critical) embedded systems, since they help to identify functional or non-functional issues from the early development stage when verification complexity is relatively lower than that of the implemented systems. Nevertheless, MDD approaches have not been widely adopted in practice mainly due to the difficulty and high initial cost of switching the development paradigm from code-centric to model-driven. This work presents a systematic method for reverse engineering abstract models from embedded codes using the notion of abstract components which act as independent units of development, validation, and verification. The recursive reverse engineering process constructs high-level abstract components from low-level ones using synchronized abstraction and projection abstraction, defined w.r.t. the information on port dependency and port bindings. This approach is demonstrated with reverse-engineered TinyOS, where each abstract component is validated and verified using model simulation and model checking.
  • Keywords
    embedded systems; program verification; reverse engineering; safety-critical software; MDD; TinyOS; embedded software verification; high-level abstract component; model checking; model simulation; model-based development; projection abstraction; reverse engineering; safety-critical embedded system; synchronized abstraction; Embedded systems; Manuals; Radiation detectors; Reverse engineering; Switches; Synchronization; Systematics; Reverse-engineering; abstraction; component;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Assurance Systems Engineering (HASE), 2010 IEEE 12th International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1530-2059
  • Print_ISBN
    978-1-4244-9091-2
  • Electronic_ISBN
    1530-2059
  • Type

    conf

  • DOI
    10.1109/HASE.2010.20
  • Filename
    5634316