Generation of Mixed Broadside and Skewed-Load Diagnostic Test Sets for Transition Faults

Author

Pomeranz, Irith

Author_Institution

Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA

fYear

2011

fDate

12-14 Dec. 2011

Firstpage

45

Lastpage

52

Abstract

This paper describes a diagnostic test generation procedure for transition faults that produces mixed test sets consisting of broadside and skewed-load tests. A mix of broadside and skewed-load tests yields improved diagnostic resolution compared with a single test type. The procedure starts from a mixed test set generated for fault detection. It uses two procedures to obtain new tests that are useful for diagnosis starting from existing tests. Both procedures allow the type of a test to be modified (from broadside to skewed-load and from skewed-load to broadside). The first procedure is fault independent. The second procedure targets specific fault pairs. Experimental results show that diagnostic test generation changes the mix of broadside and skewed-load tests in the test set compared with a fault detection test set.

Keywords

automatic test pattern generation; fault diagnosis; integrated circuit testing; diagnostic test generation; fault detection; fault diagnosis; mixed broadside test sets; skewed load diagnostic test; transition faults; Circuit faults; Computational modeling; Delay; Failure analysis; Fault detection; Fault diagnosis; Logic gates; Broadside tests; diagnostic test generation; scan circuits; skewed-load tests; transition faults;

fLanguage

English

Publisher

ieee

Conference_Titel

Dependable Computing (PRDC), 2011 IEEE 17th Pacific Rim International Symposium on

Conference_Location

Pasadena, CA

Print_ISBN

978-1-4577-2005-5

Electronic_ISBN

978-0-7695-4590-5

Type

conf

DOI

10.1109/PRDC.2011.15

Filename

6133065