Title :
A performance study of two wavelet-based edge detectors
Author :
Kim, HyungJun ; Kim, W. ; Li, C.C.
Author_Institution :
Dept. of Electr. Eng., Pittsburgh Univ., PA, USA
fDate :
30 Aug-3 Sep 1992
Abstract :
Experimental performances of Mallat-Zhong wavelet edge detector and a specially constructed SDD wavelet edge detector were studied. It was observed that the former performed better in terms of lower false recognition rate and lower false detection rate, but both have similar localization performance
Keywords :
edge detection; wavelet transforms; Mallat-Zhong wavelet edge detector; SDD wavelet edge detector; false detection rate; false recognition rate; localization performance; Detectors; Discrete wavelet transforms; Fourier transforms; Image edge detection; Image processing; Image recognition; Low pass filters; Signal resolution; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2920-7
DOI :
10.1109/ICPR.1992.201985
