DocumentCode
3062045
Title
Performance comparison of line parametrizations
Author
Hu, Zhanyi ; Destiné, J.
Author_Institution
Service de Microelectron., Liege Univ., Belgium
fYear
1992
fDate
30 Aug-3 Sep 1992
Firstpage
335
Lastpage
338
Abstract
The performance of the Hough transform depends on parametrization schemes as well as mapping procedures. Based on criteria such as normalized-variance and risk-ratio the authors find that normal parametrization is the best among the four frequently mentioned ones in literature, if uniform noise is present in the image space
Keywords
Hough transforms; image processing; Hough transform; image processing; line parametrizations; mapping procedures; normal parametrization; normalized-variance; performance comparison; risk-ratio; uniform noise; Concurrent computing; Graphics; Hardware; Integrated circuit noise; Parallel processing; Pattern recognition; Risk analysis; Very large scale integration; Voting;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on
Conference_Location
The Hague
Print_ISBN
0-8186-2920-7
Type
conf
DOI
10.1109/ICPR.1992.201993
Filename
201993
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