• DocumentCode
    3062525
  • Title

    Native Binary Mutation Analysis for Embedded Software and Virtual Prototypes in SystemC

  • Author

    Kuznik, Christoph ; Müller, Wolfgang

  • Author_Institution
    Fac. of Electr. Eng., Comput. Sci. & Math., Univ. of Paderborn/C-Lab., Paderborn, Germany
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    290
  • Lastpage
    291
  • Abstract
    Mutation analysis is a powerful tool for white-box testing of the verification environment in order to produce dependable and higher quality software products. However, due to high computational costs and the focus on high-level software languages such as Java mutation analysis is not yet widely used in commercial design flows targeting embedded (software) systems. Here the industry is modeling both hardware and related software parts at higher levels of abstraction, called virtual prototypes, to accelerate parallel development and shorten time-to-market. In this paper we propose a mutation testing verification flow for SystemC based virtual prototypes that may not rely on source code only but on annotated basic blocks and enables mutant creation at assembler level to heavily reduce execution costs and equivalence mutants likelihood.
  • Keywords
    C++ language; Java; parallel languages; program diagnostics; program testing; program verification; software cost estimation; virtual reality; Java mutation analysis; SystemC; annotated basic blocks; assembler level; commercial design flows; computational costs; embedded software; equivalence mutants likelihood; execution cost reduction; high-level software languages; mutation testing verification flow; native binary mutation analysis; parallel development; software products; verification environment; virtual prototypes; white-box testing; Embedded software; Embedded systems; Grammar; Java; Prototypes; Testing; dynamic verification; mutant creation; mutation analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing (PRDC), 2011 IEEE 17th Pacific Rim International Symposium on
  • Conference_Location
    Pasadena, CA
  • Print_ISBN
    978-1-4577-2005-5
  • Electronic_ISBN
    978-0-7695-4590-5
  • Type

    conf

  • DOI
    10.1109/PRDC.2011.47
  • Filename
    6133098