DocumentCode
3062525
Title
Native Binary Mutation Analysis for Embedded Software and Virtual Prototypes in SystemC
Author
Kuznik, Christoph ; Müller, Wolfgang
Author_Institution
Fac. of Electr. Eng., Comput. Sci. & Math., Univ. of Paderborn/C-Lab., Paderborn, Germany
fYear
2011
fDate
12-14 Dec. 2011
Firstpage
290
Lastpage
291
Abstract
Mutation analysis is a powerful tool for white-box testing of the verification environment in order to produce dependable and higher quality software products. However, due to high computational costs and the focus on high-level software languages such as Java mutation analysis is not yet widely used in commercial design flows targeting embedded (software) systems. Here the industry is modeling both hardware and related software parts at higher levels of abstraction, called virtual prototypes, to accelerate parallel development and shorten time-to-market. In this paper we propose a mutation testing verification flow for SystemC based virtual prototypes that may not rely on source code only but on annotated basic blocks and enables mutant creation at assembler level to heavily reduce execution costs and equivalence mutants likelihood.
Keywords
C++ language; Java; parallel languages; program diagnostics; program testing; program verification; software cost estimation; virtual reality; Java mutation analysis; SystemC; annotated basic blocks; assembler level; commercial design flows; computational costs; embedded software; equivalence mutants likelihood; execution cost reduction; high-level software languages; mutation testing verification flow; native binary mutation analysis; parallel development; software products; verification environment; virtual prototypes; white-box testing; Embedded software; Embedded systems; Grammar; Java; Prototypes; Testing; dynamic verification; mutant creation; mutation analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Computing (PRDC), 2011 IEEE 17th Pacific Rim International Symposium on
Conference_Location
Pasadena, CA
Print_ISBN
978-1-4577-2005-5
Electronic_ISBN
978-0-7695-4590-5
Type
conf
DOI
10.1109/PRDC.2011.47
Filename
6133098
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