• DocumentCode
    3063544
  • Title

    On the dynamics of ℓ1 decoding: A microscopic approach

  • Author

    Xu, Weiyu ; Tang, Ao

  • Author_Institution
    Sch. of ECE, Cornell Univ., Ithaca, NY, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    1588
  • Lastpage
    1592
  • Abstract
    1 minimization, also called Basis Pursuit, has been known to have strong sparse recovery performance both theoretically and empirically. Previously known analytical approaches for ℓ1 minimization have limitations in deriving custom stability performance bounds for signals with sparsity (the number of nonzero elements) level beyond the ℓ1 weak recovery threshold [6]. In this paper, instead of focusing on the static decoding results of ℓ1 minimization, we develop a microscopic analytical approach by studying the dynamics of ℓ1 minimization. This approach can give useful characterizations of ℓ1 decoding results and lead to new performance bounds on ℓ1 decoding error. Contrary to known stability results for ℓ1 minimization below the ℓ1 weak threshold, we prove that ℓ1 minimization decoding errors can experience an explosive growth in terms of the signal tail immediately beyond the ℓ1 minimization weak threshold. This new analytical approach is motivated by the applications of analyzing the emerging iterative reweighted ℓ1 minimization algorithms.
  • Keywords
    iterative decoding; signal processing; basis pursuit; iterative reweighted l1 minimization algorithms; l1 minimization decoding error; microscopic analytical approach; sparse signal recovery performance; stability performance bounds; static decoding; weak recovery threshold; Algorithm design and analysis; Explosives; Iterative decoding; Iterative methods; Microscopy; Minimization methods; Performance analysis; Signal analysis; Stability analysis; Tail;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-7890-3
  • Electronic_ISBN
    978-1-4244-7891-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2010.5513438
  • Filename
    5513438