Title :
Built-In Self-Test of programmable input/output tiles in Virtex-5 FPGAs
Author :
Dutton, Bradley F. ; Stroud, Charles E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL
Abstract :
A built-in self-test (BIST) approach is presented for the logic resources in the programmable input/output (I/O) tiles in Virtex-5 field programmable gate arrays (FPGAs). A total of 15 BIST configurations were developed to test the I/O cell programmable logic resources in all modes of operation. The approach utilizes dedicated I/O buffer bypass routing in the I/O tile such that the BIST is package independent and applicable to all levels of testing from wafer-level to system-level. The approach offers control of BIST execution and maximal diagnostic resolution of faulty I/O tiles for device and package independent testing. Either the boundary scan interface or a simple system-level interface may be used for BIST execution, control, and diagnosis independent of the configuration interface. Experimental results are presented including fault detection capabilities.
Keywords :
boundary scan testing; built-in self test; fault diagnosis; field programmable gate arrays; logic testing; Virtex-5 FPGA; boundary scan interface; built-in self-test approach; dedicated I/O buffer bypass routing; device independent testing; fault detection; field programmable gate array; package independent testing; programmable input/output tile; programmable logic resource testing; system-level interface; system-level testing; wafer-level testing; Built-in self-test; Field programmable gate arrays; Logic testing; Packaging; Programmable logic arrays; Programmable logic devices; Routing; System testing; Tiles; Wafer scale integration; Built-In Self-Test; Field Programmable Gate Array; Virtex-5; programmable input/output tiles;
Conference_Titel :
System Theory, 2009. SSST 2009. 41st Southeastern Symposium on
Conference_Location :
Tullahoma, TN
Print_ISBN :
978-1-4244-3324-7
Electronic_ISBN :
0094-2898
DOI :
10.1109/SSST.2009.4806779
